A Comparison of the Hard-Switching Performance of 650 V Power Transistors With Calorimetric Verification
We compare the switching losses of four equivalent silicon and wide-bandgap 650 V power transistors operated in a hard-switched half-bridge configuration, switching 400 V at 40 A. Each transistor is mounted on an identical PCB and driven by a gate drive circuit matched to its requirements. Switching...
Main Authors: | , , , , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2023-01-01
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Series: | IEEE Open Journal of Power Electronics |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10251536/ |