A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images

In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes a topical subject in the industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in practice, where deep learning-based algorithms perform better...

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Bibliographic Details
Main Authors: Yajie Cui, Zhaoxiang Liu, Shiguo Lian
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10144292/