Hot pixel classification of single‐photon avalanche diode detector arrays using a log‐normal statistical distribution
CMOS single‐photon avalanche diode (SPAD) detector arrays are commonly used in low‐light imaging applications, and are known to suffer from certain defects which cause ‘hot pixels’. These are detectors which exhibit a significantly larger than average dark count rate, adding noise to the data. Typic...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2019-09-01
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| Series: | Electronics Letters |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/el.2019.1427 |