Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm Attenuation
Digital holographic microscopy is a powerful 3D imaging tool for industrial surface inspection and scientific experiment evaluation, as it provides lateral resolution similar to classical microscopy and very fine axial resolution. This paper presents the results and the findings of experimental holo...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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IFSA Publishing, S.L.
2020-12-01
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| Series: | Sensors & Transducers |
| Subjects: | |
| Online Access: | https://sensorsportal.com/HTML/DIGEST/december_2020/Vol_247/P_3191.pdf |
| _version_ | 1797754481101766656 |
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| author | Marek Stašík František Kaván Marek Mach Karolína Sedláčková |
| author_facet | Marek Stašík František Kaván Marek Mach Karolína Sedláčková |
| author_sort | Marek Stašík |
| collection | DOAJ |
| description | Digital holographic microscopy is a powerful 3D imaging tool for industrial surface inspection and scientific experiment evaluation, as it provides lateral resolution similar to classical microscopy and very fine axial resolution. This paper presents the results and the findings of experimental holographic microscope development. The device construction is described. The research emphasises on two- wavelength interferometry combined with phase shifting. The phase shifting was done using acousto-optic modulators, which allow precise tuning of light frequency. A developed enhanced measurement procedure which increases versatility by increasing dynamic range is described. Developed algorithms for data evaluation are presented and measured experimental data visualised. |
| first_indexed | 2024-03-12T17:34:03Z |
| format | Article |
| id | doaj.art-cfc691ec5e3548429ab596f23e4f45e4 |
| institution | Directory Open Access Journal |
| issn | 2306-8515 1726-5479 |
| language | English |
| last_indexed | 2024-03-12T17:34:03Z |
| publishDate | 2020-12-01 |
| publisher | IFSA Publishing, S.L. |
| record_format | Article |
| series | Sensors & Transducers |
| spelling | doaj.art-cfc691ec5e3548429ab596f23e4f45e42023-08-04T15:34:04ZengIFSA Publishing, S.L.Sensors & Transducers2306-85151726-54792020-12-012478817Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm AttenuationMarek Stašík0František Kaván1Marek Mach2Karolína Sedláčková3Technical University of Liberec, Institute of New Technologies and Applied InformaticsTechnical University of Liberec, Institute of New Technologies and Applied InformaticsRegional Centre for Special Optics and Optoelectronic Systems (TOPTEC), Institute of Plasma Physics, Academy of Sciences of the Czech RepublicTechnical University of Liberec, Institute of New Technologies and Applied InformaticsDigital holographic microscopy is a powerful 3D imaging tool for industrial surface inspection and scientific experiment evaluation, as it provides lateral resolution similar to classical microscopy and very fine axial resolution. This paper presents the results and the findings of experimental holographic microscope development. The device construction is described. The research emphasises on two- wavelength interferometry combined with phase shifting. The phase shifting was done using acousto-optic modulators, which allow precise tuning of light frequency. A developed enhanced measurement procedure which increases versatility by increasing dynamic range is described. Developed algorithms for data evaluation are presented and measured experimental data visualised.https://sensorsportal.com/HTML/DIGEST/december_2020/Vol_247/P_3191.pdfmicroscopeinterferometryphase shiftingbragg cellacousto-optic modulatormultiwavelength interferometryhigh dynamic range |
| spellingShingle | Marek Stašík František Kaván Marek Mach Karolína Sedláčková Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm Attenuation Sensors & Transducers microscope interferometry phase shifting bragg cell acousto-optic modulator multiwavelength interferometry high dynamic range |
| title | Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm Attenuation |
| title_full | Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm Attenuation |
| title_fullStr | Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm Attenuation |
| title_full_unstemmed | Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm Attenuation |
| title_short | Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm Attenuation |
| title_sort | advanced measurement procedure for interferometric microscope for three dimensional imaging of complex surfaces using two wavelength interferometry and reference arm attenuation |
| topic | microscope interferometry phase shifting bragg cell acousto-optic modulator multiwavelength interferometry high dynamic range |
| url | https://sensorsportal.com/HTML/DIGEST/december_2020/Vol_247/P_3191.pdf |
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