Determination of the Dielectric Constant of Niobium Oxide by Using Combined EIS and Ellipsometric Methods
Combining ellipsometric and EIS methods, the dielectric constant ε for the oxide Nb<sub>2</sub>O<sub>5</sub> at room temperature was determined. At first, the linear dependence between anodization voltage and oxide thickness was established in the form <i>d</i> =...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-01-01
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| Series: | Materials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1944/16/2/798 |