Modeling of Changes in the Resistivity of Semi Insulating Gallium Phosphide under the Influence of Lighting

Modeling of Changes in the Resistivity of Semi Insulating Gallium Phosphide under the Influence of Lighting

The article presents the results of a simulation of changes in gallium phosphide (GaP) resistivity under the influence of lighting. The adopted model of the defect structure is presented along with the defect parameters. Initial conditions created on the basis of a tested material sample, labeled Ga...

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Bibliographic Details
Main Authors: Karol Piwowarski, Witold Kaczmarek, Marek Suproniuk, Bogdan Perka, Piotr Paziewski
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Energies
Subjects:
gallium phosphide
resistivity
modeling
defect centers
optoelectronic devices
Online Access:https://www.mdpi.com/1996-1073/16/4/1725

Internet

https://www.mdpi.com/1996-1073/16/4/1725

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