An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons

In the atmosphere, it is generally understood that neutrons are the main contributor to the soft error rate (SER) in electronic devices. These particles are indeed able to trigger nuclear reactions in the sensitive regions of the devices, leading to secondary ions that may ionize the matter sufficie...

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Bibliographic Details
Main Authors: Frédéric Wrobel, Ygor Aguiar, Cleiton Marques, Giuseppe Lerner, Rubén García Alía, Frédéric Saigné, Jérôme Boch
Format: Article
Language:English
Published: MDPI AG 2022-12-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/12/1/104