An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons
In the atmosphere, it is generally understood that neutrons are the main contributor to the soft error rate (SER) in electronic devices. These particles are indeed able to trigger nuclear reactions in the sensitive regions of the devices, leading to secondary ions that may ionize the matter sufficie...
Main Authors: | Frédéric Wrobel, Ygor Aguiar, Cleiton Marques, Giuseppe Lerner, Rubén García Alía, Frédéric Saigné, Jérôme Boch |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-12-01
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Series: | Electronics |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-9292/12/1/104 |
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