Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications

Bibliographic Details
Format:	Article
Language:	English
Published:	Public Library of Science (PLoS) 2023-01-01
Series:	PLoS ONE
Online Access:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10310016/?tool=EBI

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