Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy

Mechanical Characterization of Two-Segment Free-Standing ZnO Nanowires Using Lateral Force Microscopy

Mechanical characterization of quasi one-dimensional nanostructures is essential for the design of novel nanoelectromechanical systems. However, the results obtained on basic mechanical quantities, such as Young’s modulus and fracture strength, show significant standard deviation in the literature....

Full description

Bibliographic Details
Main Authors: János Volk, János Radó, Zsófia Baji, Róbert Erdélyi
Format: Article
Language:English
Published: MDPI AG 2022-11-01
Series:Nanomaterials
Subjects:
nanomechanical characterization
bending modulus
ZnO nanowire
atomic layer deposition
Euler–Bernoulli beam theory
piezotronics
Online Access:https://www.mdpi.com/2079-4991/12/23/4120

Internet

https://www.mdpi.com/2079-4991/12/23/4120

Similar Items