Exceptional point enhanced nanoparticle detection in deformed Reuleaux-triangle microcavity

Exceptional point enhanced nanoparticle detection in deformed Reuleaux-triangle microcavity

Abstract In this paper, we propose a deformed Reuleaux-triangle resonator (RTR) to form exceptional point (EP) which results in the detection sensitivity enhancement of nanoparticle. After introducing single nanoparticle to the deformed RTR at EP, frequency splitting obtains an enhancement of more t...

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Bibliographic Details
Main Authors: Jinhao Fei, Xiaobei Zhang, Qi Zhang, Yong Yang, Zijie Wang, Chuanlu Deng, Yi Huang, Tingyun Wang
Format: Article
Language:English
Published: Springer & Higher Education Press 2024-08-01
Series:Frontiers of Optoelectronics
Subjects:
Exceptional point
Deformed microcavity
Nanoparticle detection
Far-field pattern
Online Access:https://doi.org/10.1007/s12200-024-00131-5

Internet

https://doi.org/10.1007/s12200-024-00131-5

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