Resonant phase escape in Bi2Sr2CaCu2O8+δ surface intrinsic Josephson junctions

Resonant phase escape in Bi2Sr2CaCu2O8+δ surface intrinsic Josephson junctions

We present a study of phase escape in surface Bi _2 Sr _2 CaCu _2 O _8+ _δ intrinsic Josephson junctions in the presence of microwave radiation. The measured switching current distributions display clear double-peak structures in the microwave field, which result from the single- and two-photon reso...

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Bibliographic Details
Main Authors: H F Yu, X B Zhu, J K Ren, Z H Peng, D J Cui, H Deng, W H Cao, Ye Tian, G H Chen, D N Zheng, X N Jing, Li Lu, S P Zhao
Format: Article
Language:English
Published: IOP Publishing 2013-01-01
Series:New Journal of Physics
Online Access:https://doi.org/10.1088/1367-2630/15/9/095006

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https://doi.org/10.1088/1367-2630/15/9/095006

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