Synergistic Effect of TID and SEE in 130 nm 7T SOI SRAM

Synergistic Effect of TID and SEE in 130 nm 7T SOI SRAM

The space environment is a very harsh operating environment, and space radiation can directly affect the operation of electronic devices causing total ionizing dose (TID), single event effect (SEE) and displacement damage (DD). For most devices TID and SEE are the two most dominant effects, the stud...

Full description

Bibliographic Details
Main Author: XIAO Shuyan1, GUO Gang1, WANG Linfei2, ZHANG Zheng1, CHEN Qiming1, GAO Linchun2, WANG Chunlin2, ZHANG Fuqiang1, ZHAO Shuyong1, LIU Jiancheng1
Format: Article
Language:English
Published: Editorial Board of Atomic Energy Science and Technology 2024-02-01
Series:Yuanzineng kexue jishu
Subjects:
total ionizing dose
single event effect
synergistic effect
single event upset
static random access memory
Online Access:https://yznkxjs.xml-journal.net/cn/article/doi/10.7538/yzk.2023.youxian.0347

Internet

https://yznkxjs.xml-journal.net/cn/article/doi/10.7538/yzk.2023.youxian.0347

Similar Items