Synergistic Effect of TID and SEE in 130 nm 7T SOI SRAM
The space environment is a very harsh operating environment, and space radiation can directly affect the operation of electronic devices causing total ionizing dose (TID), single event effect (SEE) and displacement damage (DD). For most devices TID and SEE are the two most dominant effects, the stud...
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| Format: | Article |
| Language: | English |
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Editorial Board of Atomic Energy Science and Technology
2024-02-01
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| Series: | Yuanzineng kexue jishu |
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| Online Access: | https://yznkxjs.xml-journal.net/cn/article/doi/10.7538/yzk.2023.youxian.0347 |