Determination of the electron distribution in thin barrier AlGaAs/GaAs superlattices by capacitance-voltage profiling
Electron density distribution in uniformly doped AlGaAs/GaAs superlattices with respective layer thicknesses 1.5/10 nm and a different number of quantum wells was investigated. Experimental samples containing 3, 5 and 25 periods with the same layer parameters were grown by molecular beam epitaxy. Ca...
Main Authors: | Elena I. Vasilkova, Evgeny V. Pirogov, Maxim S. Sobolev, Artem I. Baranov, Alexander S. Gudovskikh, Alexei D. Bouravleuv |
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Format: | Article |
Language: | English |
Published: |
Saint Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO University)
2022-12-01
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Series: | Naučno-tehničeskij Vestnik Informacionnyh Tehnologij, Mehaniki i Optiki |
Subjects: | |
Online Access: | https://ntv.ifmo.ru/file/article/21644.pdf |
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