High-resolution electron microscopy and electron diffraction of perovskite-type superconducting copper oxides
High-resolution electron microscopy and electron diffraction are quite useful for structural characterization of perovskite-type superconducting copper oxides on the atomic scale. Valuable information on the crystal structures and the microstructures could be obtained from observed high-resolution i...
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| Aineistotyyppi: | Artikkeli |
| Kieli: | English |
| Julkaistu: |
De Gruyter
2014-10-01
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| Sarja: | Nanotechnology Reviews |
| Aiheet: | |
| Linkit: | https://doi.org/10.1515/ntrev-2014-0003 |