All-Dielectric Transreflective Angle-Insensitive Near-Infrared (NIR) Filter

All-Dielectric Transreflective Angle-Insensitive Near-Infrared (NIR) Filter

This paper presents an all-dielectric, cascaded, multilayered, thin-film filter, allowing near-infrared filtration for spectral imaging applications. The proposed design is comprised of only eight layers of amorphous silicon (A-Si) and silicon nitride (Si<inline-formula><math xmlns="ht...

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Bibliographic Details
Main Authors: Ayesha Shaukat, Rahila Umer, Frazer Noble, Khalid Mahmood Arif
Format: Article
Language:English
Published: MDPI AG 2022-07-01
Series:Nanomaterials
Subjects:
NIR filter
thin films
angle invariance
FDTD
spectroscopic ellipsometry
Online Access:https://www.mdpi.com/2079-4991/12/15/2537

Internet

https://www.mdpi.com/2079-4991/12/15/2537

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