Synchrotron Based X-ray Microtomography Reveals Cellular Morphological Features of Developing Wheat Grain

Synchrotron Based X-ray Microtomography Reveals Cellular Morphological Features of Developing Wheat Grain

Wheat is one of the most important crops in the world, mainly used for human consumption and animal feed. To overcome the increasing demand in wheat production, it is necessary to better understand the mechanisms involved in the growth of the wheat grain. X-ray computed tomography is an efficient me...

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Bibliographic Details
Main Authors: David Legland, Camille Alvarado, Eric Badel, Fabienne Guillon, Andrew King, Thang Duong Quoc Le, Camille Rivard, Louis Paré, Anne-Laure Chateigner-Boutin, Christine Girousse
Format: Article
Language:English
Published: MDPI AG 2022-03-01
Series:Applied Sciences
Subjects:
wheat grain
cell morphology
micro-CT
phase-contrast tomography
grain development
Online Access:https://www.mdpi.com/2076-3417/12/7/3454

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https://www.mdpi.com/2076-3417/12/7/3454

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