Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
The continuous scaling of electronic components has led to the development of high-performance microprocessors that are suitable even for safety-critical applications where radiation-induced errors such as Single Event Effects (SEEs) can have a significant impact on the performance and reliability o...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-12-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/12/1/169 |