CHARGE syndrome modeling using patient-iPSCs reveals defective migration of neural crest cells harboring CHD7 mutations

CHARGE syndrome modeling using patient-iPSCs reveals defective migration of neural crest cells harboring CHD7 mutations

CHARGE syndrome is caused by heterozygous mutations in the chromatin remodeler, CHD7, and is characterized by a set of malformations that, on clinical grounds, were historically postulated to arise from defects in neural crest formation during embryogenesis. To better delineate neural crest defects...

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Bibliographic Details
Main Authors: Hironobu Okuno, Francois Renault Mihara, Shigeki Ohta, Kimiko Fukuda, Kenji Kurosawa, Wado Akamatsu, Tsukasa Sanosaka, Jun Kohyama, Kanehiro Hayashi, Kazunori Nakajima, Takao Takahashi, Joanna Wysocka, Kenjiro Kosaki, Hideyuki Okano
Format: Article
Language:English
Published: eLife Sciences Publications Ltd 2017-11-01
Series:eLife
Subjects:
CHD7
CHARGE syndrome
induced pluripotent stem cells
neural crest
cell migration
disease modeling
Online Access:https://elifesciences.org/articles/21114

Internet

https://elifesciences.org/articles/21114

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