Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young's experiment

Characterizing transverse coherence of an ultra-intense focused X-ray free-electron laser by an extended Young's experiment

Characterization of transverse coherence is one of the most critical themes for advanced X-ray sources and their applications in many fields of science. However, for hard X-ray free-electron laser (XFEL) sources there is very little knowledge available on their transverse coherence characteristics,...

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Bibliographic Details
Main Authors: Ichiro Inoue, Kensuke Tono, Yasumasa Joti, Takashi Kameshima, Kanade Ogawa, Yuya Shinohara, Yoshiyuki Amemiya, Makina Yabashi
Format: Article
Language:English
Published: International Union of Crystallography 2015-11-01
Series:IUCrJ
Subjects:
X-ray free-electron lasers
transverse coherence
beam diagnostics
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252515015523

Internet

http://scripts.iucr.org/cgi-bin/paper?S2052252515015523

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