Band Bending and Trap Distribution along the Channel of Organic Field-Effect Transistors from Frequency-Resolved Scanning Photocurrent Microscopy
The scanning photocurrent microscopy (SPCM) method is applied to pentacene field-effect transistors (FETs). In this technique, a modulated laser beam is focused and scanned along the channel of the transistors. The resulting spatial photocurrent profile is attributed to extra free holes generated fr...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-06-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/11/11/1799 |