Atomic Force Microscopy and Raman Microspectroscopy Investigations of the Leaching of Chalcopyrite (112) Surface

Atomic Force Microscopy and Raman Microspectroscopy Investigations of the Leaching of Chalcopyrite (112) Surface

The aim of this study was to determine the reactivity of the chalcopyrite (112) surface under industrially relevant leaching conditions. Leaching of the chalcopyrite (112) surface was carried out at approximately pH 1 and in the presence of 0.01 M ferric or ferrous. The atomic force microscopy (AFM)...

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Bibliographic Details
Main Authors: Gujie Qian, Christopher T. Gibson, Sarah Harmer-Bassell, Allan Pring
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Minerals
Subjects:
AFM analysis
chalcopyrite leaching
dissolution rate
Raman spectroscopy
surface roughness
Online Access:https://www.mdpi.com/2075-163X/10/6/485

Internet

https://www.mdpi.com/2075-163X/10/6/485

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