Thermoelectric La-doped SrTiO3 epitaxial layers with single-crystal quality: from nano to micrometers

High-quality thermoelectric La0.2Sr0.8TiO3 (LSTO) films, with thicknesses ranging from 20 nm to 0.7 μm, have been epitaxially grown on SrTiO3(001) substrates by enhanced solid-source oxide molecular-beam epitaxy. All films are atomically flat (with rms roughness < 0.2 nm), with low mosaicity (<...

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Bibliographic Details
Main Authors: Mihai Apreutesei, Régis Debord, Mohamed Bouras, Philippe Regreny, Claude Botella, Aziz Benamrouche, Adrian Carretero-Genevrier, Jaume Gazquez, Geneviève Grenet, Stéphane Pailhès, Guillaume Saint-Girons, Romain Bachelet
Format: Article
Language:English
Published: Taylor & Francis Group 2017-12-01
Series:Science and Technology of Advanced Materials
Subjects:
Online Access:http://dx.doi.org/10.1080/14686996.2017.1336055