Microwave Imaging under Oblique Illumination

Microwave Imaging under Oblique Illumination

Microwave imaging based on inverse scattering problem has been attracting many interests in the microwave society. Among some major technical challenges, the ill-posed, multi-dimensional inversion algorithm and the complicated measurement setup are critical ones that prevent it from practical applic...

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Bibliographic Details
Main Authors: Qingyang Meng, Kuiwen Xu, Fazhong Shen, Bin Zhang, Dexin Ye, Jiangtao Huangfu, Changzhi Li, Lixin Ran
Format: Article
Language:English
Published: MDPI AG 2016-07-01
Series:Sensors
Subjects:
inverse scattering problem
microwave imaging
SOM
oblique incidence
Online Access:http://www.mdpi.com/1424-8220/16/7/1046

Internet

http://www.mdpi.com/1424-8220/16/7/1046

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