Microwave Imaging under Oblique Illumination
Microwave imaging based on inverse scattering problem has been attracting many interests in the microwave society. Among some major technical challenges, the ill-posed, multi-dimensional inversion algorithm and the complicated measurement setup are critical ones that prevent it from practical applic...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2016-07-01
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| Series: | Sensors |
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| Online Access: | http://www.mdpi.com/1424-8220/16/7/1046 |
| _version_ | 1798005996211142656 |
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| author | Qingyang Meng Kuiwen Xu Fazhong Shen Bin Zhang Dexin Ye Jiangtao Huangfu Changzhi Li Lixin Ran |
| author_facet | Qingyang Meng Kuiwen Xu Fazhong Shen Bin Zhang Dexin Ye Jiangtao Huangfu Changzhi Li Lixin Ran |
| author_sort | Qingyang Meng |
| collection | DOAJ |
| description | Microwave imaging based on inverse scattering problem has been attracting many interests in the microwave society. Among some major technical challenges, the ill-posed, multi-dimensional inversion algorithm and the complicated measurement setup are critical ones that prevent it from practical applications. In this paper, we experimentally investigate the performance of the subspace-based optimization method (SOM) for two-dimensional objects when it was applied to a setup designed for oblique incidence. Analytical, simulation, and experimental results show that, for 2D objects, neglecting the cross-polarization scattering will not cause a notable loss of information. Our method can be potentially used in practical imaging applications for 2D-like objects, such as human limbs. |
| first_indexed | 2024-04-11T12:47:53Z |
| format | Article |
| id | doaj.art-d5b169aa3c7e4c9683991415d6ec5573 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-04-11T12:47:53Z |
| publishDate | 2016-07-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-d5b169aa3c7e4c9683991415d6ec55732022-12-22T04:23:18ZengMDPI AGSensors1424-82202016-07-01167104610.3390/s16071046s16071046Microwave Imaging under Oblique IlluminationQingyang Meng0Kuiwen Xu1Fazhong Shen2Bin Zhang3Dexin Ye4Jiangtao Huangfu5Changzhi Li6Lixin Ran7Laboratory of Applied Research on Electromagnetics (ARE), Zhejiang University, Hangzhou 310027, ChinaLaboratory of Applied Research on Electromagnetics (ARE), Zhejiang University, Hangzhou 310027, ChinaLaboratory of Applied Research on Electromagnetics (ARE), Zhejiang University, Hangzhou 310027, ChinaLaboratory of Applied Research on Electromagnetics (ARE), Zhejiang University, Hangzhou 310027, ChinaLaboratory of Applied Research on Electromagnetics (ARE), Zhejiang University, Hangzhou 310027, ChinaLaboratory of Applied Research on Electromagnetics (ARE), Zhejiang University, Hangzhou 310027, ChinaDepartment of Electrical and Computer Engineering, Texas Tech University, Lubbock, TX 79424, USALaboratory of Applied Research on Electromagnetics (ARE), Zhejiang University, Hangzhou 310027, ChinaMicrowave imaging based on inverse scattering problem has been attracting many interests in the microwave society. Among some major technical challenges, the ill-posed, multi-dimensional inversion algorithm and the complicated measurement setup are critical ones that prevent it from practical applications. In this paper, we experimentally investigate the performance of the subspace-based optimization method (SOM) for two-dimensional objects when it was applied to a setup designed for oblique incidence. Analytical, simulation, and experimental results show that, for 2D objects, neglecting the cross-polarization scattering will not cause a notable loss of information. Our method can be potentially used in practical imaging applications for 2D-like objects, such as human limbs.http://www.mdpi.com/1424-8220/16/7/1046inverse scattering problemmicrowave imagingSOMoblique incidence |
| spellingShingle | Qingyang Meng Kuiwen Xu Fazhong Shen Bin Zhang Dexin Ye Jiangtao Huangfu Changzhi Li Lixin Ran Microwave Imaging under Oblique Illumination Sensors inverse scattering problem microwave imaging SOM oblique incidence |
| title | Microwave Imaging under Oblique Illumination |
| title_full | Microwave Imaging under Oblique Illumination |
| title_fullStr | Microwave Imaging under Oblique Illumination |
| title_full_unstemmed | Microwave Imaging under Oblique Illumination |
| title_short | Microwave Imaging under Oblique Illumination |
| title_sort | microwave imaging under oblique illumination |
| topic | inverse scattering problem microwave imaging SOM oblique incidence |
| url | http://www.mdpi.com/1424-8220/16/7/1046 |
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