Trapped ion scaling with pulsed fast gates

Fast entangling gates for trapped ion pairs offer vastly improved gate operation times relative to implemented gates, as well as approaches to trap scaling. Gates on a neighbouring ion pair only involve local ions when performed sufficiently fast, and we find that even a fast gate between a pair of...

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Бібліографічні деталі
Автори: C D B Bentley, A R R Carvalho, J J Hope
Формат: Стаття
Мова:English
Опубліковано: IOP Publishing 2015-01-01
Серія:New Journal of Physics
Предмети:
Онлайн доступ:https://doi.org/10.1088/1367-2630/17/10/103025