Elemental, structural and optical properties of nanocrystalline Zn1−xCuxSe films deposited by close spaced sublimation technique

Elemental, structural and optical properties of nanocrystalline Zn1−xCuxSe films deposited by close spaced sublimation technique

The elemental composition, film thickness and concentration depth profiles of as-deposited and annealed Zn1−xCuxSe films were studied by the Rutherford backscattering spectrometer (RBS) technique. The films were deposited on glass substrates by close spaced sublimation (CSS) technique. As-deposited...

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Xehetasun bibliografikoak
Egile Nagusiak: Muhammad Arslan, Amir Habib, Muhammad Zakria, Arshad Mehmood, Ghulam Husnain
Formatua: Artikulua
Hizkuntza:English
Argitaratua: Elsevier 2017-03-01
Saila:Journal of Science: Advanced Materials and Devices
Gaiak:
X-ray diffraction
Morphology
Dielectric constant
Spectroscopic ellipsometer
Energy band gap
Sarrera elektronikoa:http://www.sciencedirect.com/science/article/pii/S2468217916301769

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http://www.sciencedirect.com/science/article/pii/S2468217916301769

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