A new blind image conversion complexity metric for intelligent CMOS image sensors

A new blind image conversion complexity metric for intelligent CMOS image sensors

Abstract Many algorithms have been developed for complementary metal–oxide–semiconductor (CMOS) image sensors to speed up analogue‐to‐digital (A‐to‐D) conversion of captured images. However, there is no objective blind‐image quality metric available to compare and quantify the quality and effectiven...

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Bibliographic Details
Main Authors: Mohamed R. Elmezayen, Suat U. Ay
Format: Article
Language:English
Published: Wiley 2021-02-01
Series:IET Image Processing
Subjects:
Optical, image and video signal processing
Signal processing and detection
Image sensors
Optimisation techniques
Computer vision and image processing techniques
Online Access:https://doi.org/10.1049/ipr2.12053

Internet

https://doi.org/10.1049/ipr2.12053

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