A new blind image conversion complexity metric for intelligent CMOS image sensors
Abstract Many algorithms have been developed for complementary metal–oxide–semiconductor (CMOS) image sensors to speed up analogue‐to‐digital (A‐to‐D) conversion of captured images. However, there is no objective blind‐image quality metric available to compare and quantify the quality and effectiven...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2021-02-01
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| Series: | IET Image Processing |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/ipr2.12053 |