Determination of group velocity based on nanoindentation using Si and SiO2/Si wafers
The analyses of thermal transport properties can help improve the performance of high-tech semiconducting devices, such as thermoelectric generators and electronic devices. However, methods to measure thermal transport properties are limited, especially the group velocity and phonon mean free path (...
Main Authors: | Oga Norimasa, Masataka Hase, Ryotaro Mori, Mai Hayamizu, Hiroshi Murotani, Koji Miyazaki, Masayuki Takashiri |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2021-07-01
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Series: | AIP Advances |
Online Access: | http://dx.doi.org/10.1063/5.0055581 |
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