Dependence of resistivity of electrodeposited Ni single layer and Ni/Cu multilayer thin films on the film thickness, and electron mean free path measurements of these films

The Boltzmann equation is a semiclassical approach to the calculation of the electrical conductivity. In this work we will first introduce a simple model for calculation of thin film resistivity and show that in an appropriate condition the resistivity of thin films depends on the electron mean free...

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Bibliografski detalji
Glavni autor: Gholamreza Nabiyouni
Format: Članak
Jezik:English
Izdano: Isfahan University of Technology 2007-09-01
Serija:Iranian Journal of Physics Research
Teme:
Online pristup:http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-110&slc_lang=en&sid=1