Advances in Machine Condition Monitoring and Fault Diagnosis

In the past few decades, with the great progress made in the field of computer technology, non-destructive testing, signal and image processing, and artificial intelligence, machine condition monitoring and fault diagnosis technology have also achieved great technological progress and played an acti...

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Bibliographic Details
Main Authors: Wenxian Yang, Radoslaw Zimroz, Mayorkinos Papaelias
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Electronics
Subjects:
n/a
Online Access:https://www.mdpi.com/2079-9292/11/10/1563