Testability Evaluation in Time-Variant Circuits: A New Graphical Method
DC–DC converter fault diagnosis, executed via neural networks built by exploiting the information deriving from testability analysis, is the subject of this paper. The networks under consideration are complex valued neural networks (CVNNs), whose fundamental feature is the proper treatment of the ph...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-05-01
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Series: | Electronics |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-9292/11/10/1589 |