Testability Evaluation in Time-Variant Circuits: A New Graphical Method

DC–DC converter fault diagnosis, executed via neural networks built by exploiting the information deriving from testability analysis, is the subject of this paper. The networks under consideration are complex valued neural networks (CVNNs), whose fundamental feature is the proper treatment of the ph...

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Bibliographic Details
Main Authors: Marco Bindi, Maria Cristina Piccirilli, Antonio Luchetta, Francesco Grasso, Stefano Manetti
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/11/10/1589