Effects of Gate Stack Composition and Thickness in 2-D Negative Capacitance FETs

Negative capacitance (NC) field-effect transistors (FETs) with 2-D semiconducting channels have become increasingly attractive due to their ability to produce sub-60 mV/dec switching behavior in a physically scalable device. However, it has yet to be determined how gate control, including threshold...

ver descrição completa

Detalhes bibliográficos
Principais autores: Yuh-Chen Lin, Felicia McGuire, Steven Noyce, Nicholas Williams, Zhihui Cheng, Joseph Andrews, Aaron D. Franklin
Formato: Artigo
Idioma:English
Publicado em: IEEE 2019-01-01
coleção:IEEE Journal of the Electron Devices Society
Assuntos:
Acesso em linha:https://ieeexplore.ieee.org/document/8735840/