Fluorescence and Raman Micro-Spectroscopy of LiF Films Containing Radiation-Induced Defects for X-ray Detection
Lithium fluoride (LiF) film detectors for extreme ultraviolet radiation, soft and hard X-rays, based on the photoluminescence of radiation-induced electronic defects, have been proposed and are currently under further development and investigation. LiF film detectors are versatile and can be integra...
| Hlavní autoři: | , , , , , , |
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| Médium: | Článek |
| Jazyk: | English |
| Vydáno: |
MDPI AG
2023-11-01
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| Edice: | Condensed Matter |
| Témata: | |
| On-line přístup: | https://www.mdpi.com/2410-3896/8/4/103 |