Multiple Bit Error Tolerant Galois Field Architectures Over GF (2m)
Radiation induced transient faults like single event upsets (SEU) and multiple event upsets (MEU) in memories are well researched. As a result of the technology scaling, it is observed that the logic blocks are also vulnerable to malfunctioning when they are deployed in radiation prone environment....
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2012-06-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2079-9292/1/1/3 |