Effects of a slow harmonic displacement on an Atomic Force Microscope system under Lennard-Jones forces
We focus in this paper on the modeling and dynamical analysis of a tapping mode atomic force microscopy (AFM). The microbeam is subjected to a low frequency harmonic displacement of its base and to the Lennard-Jones (LJ) forces at its free end. Static and modal analysis are performed for various gap...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2016-01-01
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| Series: | MATEC Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/matecconf/20168304001 |