Copulas Arisen from Degradation-Based Time-to-Failure Models
There are a variety of degradation models in the literature, each with a certain effect of random variation around the mean degradation path on the time-to-failure of the device being degraded. To assess the dependence that the random variation around the mean degradation path exerts on the resultin...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-04-01
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| Series: | Symmetry |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-8994/14/4/785 |