Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks

Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks

Surface defect identification based on computer vision algorithms often leads to inadequate generalization ability due to large intraclass variation. Diversity in lighting conditions, noise components, defect size, shape, and position make the problem challenging. To solve the problem, this paper de...

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Bibliographic Details
Main Authors: Vignesh Sampath, Iñaki Maurtua, Juan José Aguilar Martín, Ander Iriondo, Iker Lluvia, Gotzone Aizpurua
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Sensors
Subjects:
class imbalance
convolutional neural network
defect detection
GAN
image augmentation
limited data
Online Access:https://www.mdpi.com/1424-8220/23/4/1861

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https://www.mdpi.com/1424-8220/23/4/1861

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