A novel read circuit for RRAM based on RC delay effect

Abstract In this paper, a novel Resistive Random‐Access Memory (RRAM) read circuit has been designed and verified by simulation based on the RRAM model and parasitic capacitance of the circuit. Simulation results demonstrate the feasibility and effectiveness of the proposed circuit, with accurate re...

Full description

Bibliographic Details
Main Authors: Jiabao Ye, Xuecheng Cui, Haoxiong Bi, Jifang Cao, Wannian Wang, Xiaoxin Xu, Dong Liu, Bing Chen
Format: Article
Language:English
Published: Wiley 2023-10-01
Series:Electronics Letters
Subjects:
Online Access:https://doi.org/10.1049/ell2.12964