Scanning high-sensitive x-ray polarization microscopy

Scanning high-sensitive x-ray polarization microscopy

We report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10 ^−11 ) with a μ m-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of th...

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Bibliographic Details
Main Authors: B Marx-Glowna, B Grabiger, R Lötzsch, I Uschmann, A T Schmitt, K S Schulze, A Last, T Roth, S Antipov, H-P Schlenvoigt, I Sergueev, O Leupold, R Röhlsberger, G G Paulus
Format: Article
Language:English
Published: IOP Publishing 2022-01-01
Series:New Journal of Physics
Subjects:
x-ray polarimetry
x-ray lenses
x-ray polarization microscopy
x-ray optics
channel-cut crystals
Online Access:https://doi.org/10.1088/1367-2630/ac6e80

Internet

https://doi.org/10.1088/1367-2630/ac6e80

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