Scanning high-sensitive x-ray polarization microscopy
We report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10 ^−11 ) with a μ m-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of th...
| Main Authors: | , , , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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IOP Publishing
2022-01-01
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| Series: | New Journal of Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/1367-2630/ac6e80 |
| _version_ | 1797748454151159808 |
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| author | B Marx-Glowna B Grabiger R Lötzsch I Uschmann A T Schmitt K S Schulze A Last T Roth S Antipov H-P Schlenvoigt I Sergueev O Leupold R Röhlsberger G G Paulus |
| author_facet | B Marx-Glowna B Grabiger R Lötzsch I Uschmann A T Schmitt K S Schulze A Last T Roth S Antipov H-P Schlenvoigt I Sergueev O Leupold R Röhlsberger G G Paulus |
| author_sort | B Marx-Glowna |
| collection | DOAJ |
| description | We report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10 ^−11 ) with a μ m-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the polarizer and analyzer crystals as well as the composition and the form fidelity of the lenses, which must not exhibit any birefringence. The results show that these requirements are currently only met by polymer lenses. Highly sensitive scanning x-ray polarization microscopy thus is established as a new method. It can provide new insights in a wide range of applications ranging from quantum electrodynamics and quantum optics to x-ray spectroscopy, materials research, and laser physics. |
| first_indexed | 2024-03-12T16:04:59Z |
| format | Article |
| id | doaj.art-d8d1cb2c92854124902056d845db72f8 |
| institution | Directory Open Access Journal |
| issn | 1367-2630 |
| language | English |
| last_indexed | 2024-03-12T16:04:59Z |
| publishDate | 2022-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | New Journal of Physics |
| spelling | doaj.art-d8d1cb2c92854124902056d845db72f82023-08-09T14:25:19ZengIOP PublishingNew Journal of Physics1367-26302022-01-0124505305110.1088/1367-2630/ac6e80Scanning high-sensitive x-ray polarization microscopyB Marx-Glowna0B Grabiger1R Lötzsch2I Uschmann3https://orcid.org/0000-0003-2951-4024A T Schmitt4K S Schulze5A Last6T Roth7S Antipov8H-P Schlenvoigt9https://orcid.org/0000-0003-4400-1315I Sergueev10O Leupold11R Röhlsberger12G G Paulus13Helmholtz Institute Jena , Fröbelstieg 3, D-07743 Jena, Germany; Helmholtz Centre for Heavy Ion Research (GSI) , Planckstr. 1, D-64291 Darmstadt, GermanyInstitute of Optics and Quantum Electronics, Friedrich Schiller University Jena , Max-Wien-Platz 1, D-07743 Jena, GermanyInstitute of Optics and Quantum Electronics, Friedrich Schiller University Jena , Max-Wien-Platz 1, D-07743 Jena, GermanyHelmholtz Institute Jena , Fröbelstieg 3, D-07743 Jena, Germany; Helmholtz Centre for Heavy Ion Research (GSI) , Planckstr. 1, D-64291 Darmstadt, Germany; Institute of Optics and Quantum Electronics, Friedrich Schiller University Jena , Max-Wien-Platz 1, D-07743 Jena, GermanyInstitute of Optics and Quantum Electronics, Friedrich Schiller University Jena , Max-Wien-Platz 1, D-07743 Jena, GermanyHelmholtz Institute Jena , Fröbelstieg 3, D-07743 Jena, Germany; Helmholtz Centre for Heavy Ion Research (GSI) , Planckstr. 1, D-64291 Darmstadt, GermanyInstitute of Microstructure Technology , Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, GermanyEuropean Synchrotron Radiation Facility , B. P. 220, F-38043 Grenoble Cedex, FranceEuclid TechLabs LLC , Bolingbrook, US-60440 IL, United States of AmericaHelmholtz-Zentrum Dresden-Rossendorf , Bautzner Landstr. 400, D-01328 Dresden, GermanyDESY Photon Science , Notkestr. 85, D-22607 Hamburg, GermanyDESY Photon Science , Notkestr. 85, D-22607 Hamburg, GermanyHelmholtz Institute Jena , Fröbelstieg 3, D-07743 Jena, Germany; Helmholtz Centre for Heavy Ion Research (GSI) , Planckstr. 1, D-64291 Darmstadt, Germany; DESY Photon Science , Notkestr. 85, D-22607 Hamburg, GermanyHelmholtz Institute Jena , Fröbelstieg 3, D-07743 Jena, Germany; Helmholtz Centre for Heavy Ion Research (GSI) , Planckstr. 1, D-64291 Darmstadt, Germany; Institute of Optics and Quantum Electronics, Friedrich Schiller University Jena , Max-Wien-Platz 1, D-07743 Jena, GermanyWe report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10 ^−11 ) with a μ m-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the polarizer and analyzer crystals as well as the composition and the form fidelity of the lenses, which must not exhibit any birefringence. The results show that these requirements are currently only met by polymer lenses. Highly sensitive scanning x-ray polarization microscopy thus is established as a new method. It can provide new insights in a wide range of applications ranging from quantum electrodynamics and quantum optics to x-ray spectroscopy, materials research, and laser physics.https://doi.org/10.1088/1367-2630/ac6e80x-ray polarimetryx-ray lensesx-ray polarization microscopyx-ray opticschannel-cut crystals |
| spellingShingle | B Marx-Glowna B Grabiger R Lötzsch I Uschmann A T Schmitt K S Schulze A Last T Roth S Antipov H-P Schlenvoigt I Sergueev O Leupold R Röhlsberger G G Paulus Scanning high-sensitive x-ray polarization microscopy New Journal of Physics x-ray polarimetry x-ray lenses x-ray polarization microscopy x-ray optics channel-cut crystals |
| title | Scanning high-sensitive x-ray polarization microscopy |
| title_full | Scanning high-sensitive x-ray polarization microscopy |
| title_fullStr | Scanning high-sensitive x-ray polarization microscopy |
| title_full_unstemmed | Scanning high-sensitive x-ray polarization microscopy |
| title_short | Scanning high-sensitive x-ray polarization microscopy |
| title_sort | scanning high sensitive x ray polarization microscopy |
| topic | x-ray polarimetry x-ray lenses x-ray polarization microscopy x-ray optics channel-cut crystals |
| url | https://doi.org/10.1088/1367-2630/ac6e80 |
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