Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis

This article proposes an accelerated statistical eye diagram estimation method for efficient signal integrity (SI) analysis. An eye diagram is a critical metric in the SI analysis, however obtaining an eye diagram is time-consuming in simulation. The required time might be a few weeks depending on t...

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Bibliographic Details
Main Authors: Junyong Park, Youngwoo Kim, Donghyun Kim
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10328602/