Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis
This article proposes an accelerated statistical eye diagram estimation method for efficient signal integrity (SI) analysis. An eye diagram is a critical metric in the SI analysis, however obtaining an eye diagram is time-consuming in simulation. The required time might be a few weeks depending on t...
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| Format: | Article |
| Language: | English |
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IEEE
2023-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10328602/ |
| _version_ | 1797321121649917952 |
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| author | Junyong Park Youngwoo Kim Donghyun Kim |
| author_facet | Junyong Park Youngwoo Kim Donghyun Kim |
| author_sort | Junyong Park |
| collection | DOAJ |
| description | This article proposes an accelerated statistical eye diagram estimation method for efficient signal integrity (SI) analysis. An eye diagram is a critical metric in the SI analysis, however obtaining an eye diagram is time-consuming in simulation. The required time might be a few weeks depending on the complexity. Because the eye diagram is obtained by superposition of the received waveforms. Statistical eye diagram estimation methods were proposed to make the eye diagram acquisition efficient, however, it still has a limited improvement due to a large number of convolution operations. To address this limitation, the proposed method includes two approaches: (<inline-formula> <tex-math notation="LaTeX">$i$ </tex-math></inline-formula>) an increased voltage step in the amplitude PDF with a compensation factor and (ii) skippable and replaceable convolution operations. The efficiency of the proposed method is verified by comparing the derived result with that of a conventional transient simulation. The previous estimation method requires 1,065 s while approaches (<inline-formula> <tex-math notation="LaTeX">$i$ </tex-math></inline-formula>) and (ii) reduce the required time to 88 and 510 s, respectively. When both approaches are applied, the required time is reduced to 17 s in comparison to the simulation time of 259,200 s required for a transient simulation. Approach (ii) reduces the number of convolution operations from 768,000 to 103,000. Therefore, the proposed method successfully reduces the required simulation time and the required number of convolutions to obtain a statistical eye diagram. |
| first_indexed | 2024-03-08T04:52:58Z |
| format | Article |
| id | doaj.art-d8f9cca21daa4f3b8183d24903172733 |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-03-08T04:52:58Z |
| publishDate | 2023-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-d8f9cca21daa4f3b8183d249031727332024-02-08T00:01:17ZengIEEEIEEE Access2169-35362023-01-011113269913270710.1109/ACCESS.2023.333656810328602Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity AnalysisJunyong Park0https://orcid.org/0000-0002-5446-1799Youngwoo Kim1https://orcid.org/0000-0003-0096-2296Donghyun Kim2https://orcid.org/0000-0003-2738-9549Missouri University of Science and Technology, Rolla, MO, USASejong University, Seoul, Republic of KoreaMissouri University of Science and Technology, Rolla, MO, USAThis article proposes an accelerated statistical eye diagram estimation method for efficient signal integrity (SI) analysis. An eye diagram is a critical metric in the SI analysis, however obtaining an eye diagram is time-consuming in simulation. The required time might be a few weeks depending on the complexity. Because the eye diagram is obtained by superposition of the received waveforms. Statistical eye diagram estimation methods were proposed to make the eye diagram acquisition efficient, however, it still has a limited improvement due to a large number of convolution operations. To address this limitation, the proposed method includes two approaches: (<inline-formula> <tex-math notation="LaTeX">$i$ </tex-math></inline-formula>) an increased voltage step in the amplitude PDF with a compensation factor and (ii) skippable and replaceable convolution operations. The efficiency of the proposed method is verified by comparing the derived result with that of a conventional transient simulation. The previous estimation method requires 1,065 s while approaches (<inline-formula> <tex-math notation="LaTeX">$i$ </tex-math></inline-formula>) and (ii) reduce the required time to 88 and 510 s, respectively. When both approaches are applied, the required time is reduced to 17 s in comparison to the simulation time of 259,200 s required for a transient simulation. Approach (ii) reduces the number of convolution operations from 768,000 to 103,000. Therefore, the proposed method successfully reduces the required simulation time and the required number of convolutions to obtain a statistical eye diagram.https://ieeexplore.ieee.org/document/10328602/Electromagnetic compatibility (EMC)eye diagrameye diagram estimation methodhigh-speed systemssingle-bit response (SBR)signal integrity (SI) |
| spellingShingle | Junyong Park Youngwoo Kim Donghyun Kim Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis IEEE Access Electromagnetic compatibility (EMC) eye diagram eye diagram estimation method high-speed systems single-bit response (SBR) signal integrity (SI) |
| title | Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis |
| title_full | Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis |
| title_fullStr | Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis |
| title_full_unstemmed | Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis |
| title_short | Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis |
| title_sort | accelerated statistical eye diagram estimation method for efficient signal integrity analysis |
| topic | Electromagnetic compatibility (EMC) eye diagram eye diagram estimation method high-speed systems single-bit response (SBR) signal integrity (SI) |
| url | https://ieeexplore.ieee.org/document/10328602/ |
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