Accelerated Statistical Eye Diagram Estimation Method for Efficient Signal Integrity Analysis
This article proposes an accelerated statistical eye diagram estimation method for efficient signal integrity (SI) analysis. An eye diagram is a critical metric in the SI analysis, however obtaining an eye diagram is time-consuming in simulation. The required time might be a few weeks depending on t...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2023-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10328602/ |