Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs

Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs

This paper describes a hardware/software strategy for the effective and efficient management of several distributed Memory Built-In Self-Test (MBIST) units orchestrated by a single CPU to enable the parallel testing of several memory banks. Experimental testing of the implementation on an Infineon c...

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Bibliographic Details
Main Authors: Paolo Bernardi, Augusto Maria Guerriero, Giorgio Insinga, Giovanni Paganini, Giambattista Carnevale, Matteo Coppetta, Walter Mischo, Rudolf Ullmann
Format: Article
Language:English
Published: MDPI AG 2024-01-01
Series:Electronics
Subjects:
automotive
SoC
reliability
embedded memory
testing
diagnosis
Online Access:https://www.mdpi.com/2079-9292/13/2/303

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https://www.mdpi.com/2079-9292/13/2/303

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