Novel Stacked Passivation Structure for AlGaN/GaN HEMTs on Silicon With High Johnson’s Figures of Merit

We present a high-performance AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate with novel stacked passivation layer (HfO2/SiO2). The stacked passivation structure can effectively modulate the electric field and reduce the electric field peak on the gate side, thus improving...

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Bibliographic Details
Main Authors: Xiaoyi Liu, Jian Qin, Jingxiong Chen, Jianyu Chen, Hong Wang
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10034658/