X-ray diffractometric study of HDPE/GaAs and HDPE/GaAs<Te> composites

High-density polyethylene sheets (HDPE), HDPE/GaAs and HDPE/ GaAs<Te>  composites with GaAs and GaAs<Te> semiconductor fillers were studied by X-ray diffractometry at room temperature. The degree of crystallization of these samples was calculated and it was determined that the inclusion...

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Bibliographic Details
Main Authors: N.N. Gadzhieva, G.B. Ahmadova, S.Z. Melikova, F.G. Asadov
Format: Article
Language:English
Published: Vasyl Stefanyk Precarpathian National University 2023-02-01
Series:Фізика і хімія твердого тіла
Subjects:
Online Access:https://journals.pnu.edu.ua/index.php/pcss/article/view/6346