X-ray diffractometric study of HDPE/GaAs and HDPE/GaAs<Te> composites
High-density polyethylene sheets (HDPE), HDPE/GaAs and HDPE/ GaAs<Te> composites with GaAs and GaAs<Te> semiconductor fillers were studied by X-ray diffractometry at room temperature. The degree of crystallization of these samples was calculated and it was determined that the inclusion...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Vasyl Stefanyk Precarpathian National University
2023-02-01
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| Series: | Фізика і хімія твердого тіла |
| Subjects: | |
| Online Access: | https://journals.pnu.edu.ua/index.php/pcss/article/view/6346 |
| Summary: | High-density polyethylene sheets (HDPE), HDPE/GaAs and HDPE/ GaAs<Te> composites with GaAs and GaAs<Te> semiconductor fillers were studied by X-ray diffractometry at room temperature. The degree of crystallization of these samples was calculated and it was determined that the inclusion of fillers in the polymer matrix (x=1-10% composite) leads to an increase in the degree of crystallization by 1.3-1.4 times. The obtained results are explained by the change of the upper molecular structure of the polymer. |
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| ISSN: | 1729-4428 2309-8589 |